Study of SEE in Electronics Components
with Heavy Ion Beams

The AMS detector will be kept on the International Space Station (ISS) for more than 3 years to collect data. To select electronic components for use in AMS DAQ, it is necessary to know radiation effects in these components caused by passage of various charged particles. To this end the prospective chips undergo qualification tests with heavy ion beams (¹²⁹Xe⁵⁴⁺, ¹⁹⁷Au⁷⁹⁺ and ²³⁸U⁹²⁺) at GSI . The beam energies range from 100 to 1000 MeV/Nucleon. Overall, six tests have been performed (5 at GSI and 1 in Catania). The following links provide more info on the tests:

1. "AMS beam test at GSI 31.10-9.11 2000".

2. "AMS beam tests at GSI 1.11-16.12 2001".

3. "AMS beam test at GSI 28.05-30.05 2002".

4. "AMS beam test in Catania, 3-5 February 2003".

5. "AMS beam test at GSI, 24-31 June 2005".